Electron microscopy and EDX microanalysis
The X-ray microanalysis is non-invasive and can be performed in a volume of µm3 order of magnitude. The diameter of  the area analysed can be from 0.05 µm to 5 mm. It is able to find and determine the elements with atomic numbers from 5 to 92 (from boron to uranium)
Scanning electron microscope
JEOL JSM-5500LV / EDX microanalyser - IXRF Systems
(detector GRESHAM Sirius 10)
The modular AFM instrument SOLVER PRO-M®NT-MDT, Russia
Scanning Probe Microscope  with AFM, AFAM, and STM
Electron microscopy and EDX microanalysis
The SOLVER PRO-M model is suited for:
  • Large XYZ scanning range (from atomic resolution up to 100 х 100 µm2) for samples of solids with maximal size of 100 x 20 mm2 or a dried suspension on a HOPG surface
  • Integrated optical video system with resolution of 3 µm
  • Statistical values of roughness (RMS) and grains/pores analysis
  • In ambient air:
    • Topological image - STM (Scanning Tunnelling Microscopy)/ AFM (contact + non-contact + semicontact modes)
    • Mapping of mechanical behaviour -  Phase Imaging/ Force Modulation Mode/ AFAM (Atomic Force Acoustic Microscopy)/ Adhesion Force Imaging
    • Mapping of electromagnetic behaviour -Spreading Resistance Imaging/ Magnetic Force Microscopy/ Electric Force Microscopy/ Kelvin Force Mode
  • Applications
  • New materials/ Thin Film/ Polymers/ Semiconductors/ Defect detection/ Biological samples
Optical microscopy
Magnification 50 – 500x. Light source (100 W halogen lamp) works in both transmittedand reflex mode. Bright filed, dark field and polarized technique is available. Optical stage can be easily changed by heating stage. Heating stage is supplied by programmable unit with possibility of regulation in the temperature range – 196 - +600 oC; available heating rate 0.01 – 130 oC/min. Isothermal regime allows nine different ramps. Optical microscope is connected with computer, camera and CCD camera.
BX 60 OLYMPUS with heating stage THMS 600 LINKAM
R.M.I. - DTA03
(R.M.I. Elecronic Measuring Instruments, ČR)
Differential thermal analysis
  • Temperature range 25 – 850 oC.
  • Available heating/cooling rates 1 – 25 oC/min.
  • Measurement is performed in quartz ampoules
Differential Scanning Calorimetry
(Power - compensated)
  • Temperature range -70 – 600 oC.
  • Available heating/cooling rates 0.5 – 500 oC/min.
  • Measurement is performed in alumina pans
Diamond DSC (Perkin-Elmer)
FT-IR spektrometry
  • Nicolet NEXUS (FAR - NEAR IR)
  • BioRad FTS 175C (MID - NEAR IR)
  • BioRad FTS 45 (FAR) 
FTIR spectroscopy
Operating range: 11,000 to 50 cm-1 (0.9 μm to 0.2 mm)
  • Specular and diifuze reflectance
  • Beam condenser (magnification 6x)
  • Optical cryostat (-260 to +200 °C)
       Ing. Miloslav Kincl
UV - Vis spectroscopy
The UV-Vis spectrometer LAMBDA 12 (Perkin-Elmer) is suitable for determination of optical behavior in transmission and reflectance modes of solids/liquids/suspensions in wavelengths region between 200 and 1100 nm. The instrument is equipped with the optical cryostat for measuring of optical behavior in temperature interval from -260 to 200 °C.
DSC 12E (Mettler Toledo)
Differential Scanning Calorimetry (Heat - Flow)
  • Temperature range 25 – 400 oC.
  • Available heating/cooling rates 1 - 20 oC/min.
  • Measurement is performed in alumina pans.
Autolab/Pgstat12 with FRA module
      Autolab/Pgstat12 is low/current low noise modular potentiostat/galvanostat capable of measuring maximum 250 mA, with a compliance voltage of 12 V. The instrument is equipped with a FRA module allowing to perfrom potentiostatic and galvanostatic impedance measurements in a frequency range from 10mHz to 1 MHz. In connection with ECD module, the apparatus is designed to measure currents in the range as low as 100 pA with resolution of 0.3fA. Instrumentation is used for the determination of electrical properties of solids by DC techniques, AC voltammetry, and impedance spectroscopy.
Autolab/Pgstat12 with FRA module
Digital Holographic Microscope Family DHM R1000

Digital Holographic Microscope Family DHM R1000, Lyncée Tec, Switzeland

Microscope DHM R1000 offers non-contact and nondestructive (source wavelength can be customized) measurements of various materials. It is an ideal instrument to measure vertical changes of specimen surface with sub-nanometric vertical resolution. It is also possible to restore 3D imagine of the specimen by numerical procedure. Short acquisition time enables to measure fast processes in a real time (acquisition rate of DHM is only limited by the frame rate of the camera).


Publication and an example of DHM use:

KNOTEK, P., ARSOVA, D., VATEVA, E., TICHY, L. 2009. Photo-expansion in Ge-As-S amorphous film monitored by digital holographic microscopy and atomic force microscopy. Journal of Optoelectronics and Advanced Materials, 11, 391-394.