Inventory list

 
Apparatus for evaluation of periodic and one-shot electrooptical effects 1)

Microscopes with digitizing video systems and image analysis 1)

Thermal conductivity aparatus LFA 457 - Netzsch 2)

Arc-melting and sythesis (3000 °)  2)

RF melting and synthesis  (1800 °C) 2)
 
Single crystal growth using Brigman method (up to 1000 °C)  2)

Seebeck coefficien measurement facilities, 100 - 500K and 300 - 1200K 2)
 
Hot pressing facility (2200K, 10 t) compactation and sythesis at elevated temperatures and presures2)

Spectroscopic ellipsometer VASE (Woollam, Ltd.) for spectral range 190 to 2 300 nm 3)

Spectroscopic ellipsometer IR -VASE (Woollam, Ltd.) for spectral range 1 700-33 000 nm 3)

 
 
 
 
 
Contact person:
1)  prof. Ing. Pirkl S., CSc.:  Slavomir.Pirkl@upce.cz
2)  doc. Ing. Drašar Č., Dr.: Cestmir.Drasar@upce.cz
3)  Mgr. Mistrík J., Ph.D.:    Jan.Mistrik@upce.cz